Reliability Testing
Reliability testing ensures that semiconductor devices and other products can perform consistently under real-world and extreme conditions throughout their expected lifespan. These tests expose products to stress factors such as temperature, humidity, voltage, and mechanical impact to detect early failures and validate long-term durability, stability, and quality.
Trio-Tech offers a full suite of reliability testing services, conducted in ISO-certified laboratories to meet stringent international standards:
Testing Capabilities Include:
- Highly Accelerated Stress Test (HAST – Biased / Unbiased, PCT)
- Autoclave Test
- Temperature Stress Screening (ESS / TCC)
- Thermal Shock (Air-to-Air / Liquid-to-Liquid)
- High / Low Temperature Tests (ELFR, HTOL, LTOL, HTS, LTS)
- Climatic Tests (THB, Moisture Resistance)
- Device Preconditioning, SAT, SEM Inspection, and Shear Test
- Vibration, Mechanical Shock, and Drop Testing
- Centrifuge Testing
- Gross Leak Pressurization & Bubble Testing
- Additional partner lab services: ESD Latch-up, PCB Electromigration & CAF Testing, Corrosion Analysis, and more