Burn-in Systems

Burn-in systems are integrated setups used to perform burn-in testing on electronic components, particularly semiconductors. These systems apply elevated temperatures, voltages, and electrical loads over a defined period to identify early-life failures and ensure long-term reliability. A typical burn-in system includes burn-in ovens or chambers, burn-in boards to hold the devices under test, and monitoring software to control test parameters and collect data. Burn-in systems are essential in quality assurance processes for industries like automotive, aerospace, and consumer electronics.

The COBIS-II Series is a high-speed, multi-channel burn-in system designed for testing the latest high-frequency integrated circuits (ICs). Combining a high-capacity oven with Accutron’s proven FlexBID™ dynamic driver technology, COBIS-II enables efficient dynamic device testing and reliable monitoring.

Available in 48, 96, 192, or 384-channel configurations, the system supports burn-in for both memory and logic devices. It features full computer control and monitoring, with an intuitive Windows-based graphical user interface. The integrated IPC handles system supervision, monitoring, and data logging, and communicates seamlessly via GPIB, ensuring smooth and user-friendly operation.