Burn-In System

The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated  circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology.  This system is engineered for productive dynamic device testing and reliable monitoring.

COBIS-II is a Multi-channels (48, 96, 192, 384) high speed dynamic burn-in system that is fully computer controlled and monitored. It is capable of performing burn-in for memory and logic devices.

COBIS-II IPC performs supervisory task of system control, monitoring and data logging. It communicates with the burn-in system via GPIB. All controls and operations of the system are supported by a windows based Graphical user interface software. It is flexible and user friendly.

Features:

  • Burn-In chamber with 64 burn-in slots
  • 192 digital channels per driver (expandable to 384 channels on request)
  • All digital channels can be used for both driving and monitoring
  • Software controlled monitoring and logging of temperature, bias and current. 
  • For operating life testing, secondary screening testing and high volume burn-in. 
  • For operating life testing, secondary screening testing and high volume burn-in.